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Head, Probe, & Sample Preparation

Basic AFM Operation

Rev. D Dimension 3100 Manual 103

Figure 7.2b Cantilever Holder Stand (top view)

Note: You may install the AFM cantilever holder in only one orientation because the

pins are asymmetrical.

7.2.4 Load the Cantilever Holder

Contact Mode AFM

Silicon nitride substrates are used for SPM operation in Contact Mode AFM. Silicon nitride

substrates consist of a cantilever integrated with a sharp tip on the end. For Contact Mode AFM

imaging, the cantilever must be soft enough to deﬂect very small forces and have a high enough

resonant frequency to avoid vibrational instabilities.

Note: Install silicon nitride substrates face-up so the tip points away from the AFM

cantilever holder. This ensures that the cantilever and tip face toward the sample

once the cantilever holder is mounted on the head.

To install a silicon nitride substrate on the AFM cantilever holder, complete the following:

1. Using sharp tweezers, grasp the substrate firmly on the sides and lift to free the substrate

from the wafer or gel-pack. In the gel-pack boxes the tip ends are pointing upward and do not

need to be turned over before being placed in the cantilever holder.

Note: Refer to Chapter 6 for detailed information on how to break out each substrate

from the wafer.

2. Many silicon nitride substrates have cantilevers on both ends of the substrate. If this is the

case, place the substrate under an optical microscope or magnifier and locate the substrate

you want to use.

3. Press down and slide back the spring clip of the standard AFM cantilever holder (see Figure

7.2c).

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Dell 3100 Spécifications Page 123